EQUIP-TEST, s.r.o.

TR518EP
This System is the most popular MDA model in the Electronics industry, offering excellent performance and high-end accuracy.

Main general features:

• Coverage of up to 3200 test points – due to high-density pin-point design and latest software technology
• Equipped with HP TestJet & Intel® Socket Test Technology (98% coverage of BGA sockets)
• MS-Windows Version system software (user-friendly interface design)
• Complete optional modules include Frequency, Voltage and Current measurement.
• Advanced durable REED Relay Switching design (high guarding ratio)
• Above average cost-performance efficiency rating
• Simple but reliable Fixture design (available in Press Type, Vacuum Type and either off-line or in-Line)

Summary of Technical Features

• Auto-Learning and Automatic Program Generation of Opens/Shorts, Pin Information, IC Clamping Diode & HP TestJet Test Technologies
• 3 point Capacitor Polarity Test
• Measurement Switching Matrix:
• 6-wire measurement
• Analog Measurement
• AC Voltmeter (0~100V), DC Voltmeter (0~±100V), Resolution: 2.5mV~50mV
• Programmable Frequency: 100Hz, 1KHz, 10KHz, 100KHz and 1MHz
• Programmable DC Voltage Source (0~±12V), DC Current Source (0~±200mA), AC Voltage Source (0~7Vrms) 
Measuring Range
  Resistance : 1.0Ω~40MΩ 

  Transistor : ±5V
  Capacitance : 1.0pF~40mF
  Zener Diode : 0.1V~48V 

  Inductance : 1.0µH~60H
  Diode : 0.1V~9.99V
• Frequency range 0~100KHz, Resolution:0.15Hz
• Test Pins: Standard 256pins (expandable in increments of 128 pins to 3200 pins)
• Test Steps: Standard 20480 steps
• Test Time : Open/Short check 1 sec./1000pins (0.8msec.~22msec./ component)
• Equipped with Automatic Guarding points selection, Auto-alignment function and Multiple Safety Protection Design
• Alternative learning module (for automatic generation of IC Reverse Check program)
• Built in system self-diagnostic function
• Networking available
• Test program remote download modification and users authority management
• Quality management and statistic analysis reports
• BoardView function – for instant defect device and pin allocation
• Polarity Detection of Capacitors (with leakage current measurement)
• Testing of small Capacitors and Inductors with 1MHz AC signal possible
• Transistor, FET, SCR, and Photo Coupler testing mode available
• Arbitrary Waveform Generator (AWG)
• Pin Contact Check capability