» PRODUCTS » IN-CIRCUIT TEST SYSTEMS » TR 5001 - ICT Test System Family: TR5001
This Test System family from TRI is basically a combined In-Circuit and Functional System, of which, to date, over 450 Units have been supplied worldwide
Model: TR5001V
The TR5001V system offers a mix of MDA, ICT and FCT Test within one platform –offering a complete testing model, which provides a cost-effective testing solution according to the needs of the customer. The TR5001V incorporates In-Circuit and Functional Test and cuts production line staff costs, saves testing time and increases productivity.
Main General Features:
• Cost-effective MDA with full upgrade Options
• Built in Functional Test solution with advanced PXI Module architecture
• Powerful options for On-Board Programming and BoundaryScan Test
• Allows use of dual-stage Fixtures (ICT + FCT)
• Digital 1:1 Driver/Receiver per Pin Architecture Design
• Reed-relay Switch offers high speed and high reliability
• Up to 3200 Analog Test Points or 600 Digital Test Points.
Specification Summary:
Part 1: High-performance Manufacturing Defect Analyzer (MDA):
• RCL Measurement
• Agilent TestJet Technology
• Intel® Socket Test Technology (A superior test method that can replace Intel CPU B-Scan and TestJet with increased coverage)
• Capacitor Polarity Test
• Transistor / Diode Measurement
Part 2: Full Digital In-Circuit Test (ICT):
• User Friendly Interface: colour syntax program editor, C-like test language, Editable waveform display tool, Integrated development environment
• Easy-to-use On-Board Programming Software
• Powerful BoundaryScan and Cluster Test Capability
• Especially cost-effective Test Strategy
Part 3: Functional Test:
• Built-In PXI Module Solution
Additional Features:
• Auto-Link Software for ICT and AOI Optimization
• System for PCB Yield Management