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EQUIP-TEST
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Model TR8001LV (Low Voltage Testing):


The TR8001LV System represents a new-generation within the TR8001 Test System family and offers stronger driving ability. It targets the trend of low-voltage IC testing in the industry today. Due to its combination with the analog testing module (ATM), the testing performance has a greater precision.


Main General Features:

• Non-multiplexing Driver/Receiver 1:1 per Pin Architecture Design
• High Fault Coverage, High Performance, High Throughput,
• Fast and easy Test Program Development
• User-friendly On-Board Programming Software Modules
• Low Voltage Test Capability

Specification Summary:

• Offers Low Voltage Testing Technologies
• Flash Programming:
> Supports a macro command language
> Conditional and Multi-vendor programming
• Serial Device Programming:
> Menu based test program generation
> Conditional and Multi- vendor programming
• User Friendly Interface:
> Colour syntax program editor
> C-like test language
> Editable waveform display tool
> Integrated development environment
• Easy Model Development:
> Import pin information
> Library syntax check
> Integrated GUI for all device types
• Powerful BoundaryScan Test Capability:
> Supports text file, data base, and DLL interfaces
> S/N and operator ID check
> Multi data exchange protocol
• Extremely cost-effective Test Strategy:
> Optimized Nail Placement with 1:1 Ratio Flexibility
> ECNs do not require moving existing wires in your fixture
> 1:1 Driver/Receiver Pins allow fast Test Program development and Debug

Additional Features:
• Auto-Link Software for ICT and AOI Optimization
• System for PCB Yield Management

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