EQUIP-TEST, s.r.o.

Model: TR518FI
Intelligent, auto-loading In-Line MDA System, which meets the complex process requirements of the electronics industry. The compact design and safe PLC control satisfies high-volume production demands. This In-Line system can adapt any TR518F series MDA system.

Main general features:
• More compact design – width only 100cm
• Connected with loader, unloader and stock magazine units
• Push-in type Fixture design
• Safe PLC control - with auto-printing system
• User-friendly and above average cost-performance efficiency rating

Summary of Technical Features
• Auto-Learning and Automatic Program Generation of Opens/Shorts, Pin Information, IC Clamping Diode & HP TestJet Test Technologies
• 3 point Capacitor Polarity Test
• Measurement Switching Matrix:
• 6-wire measurement
• Analog Measurement
• AC Voltmeter (0~100V), DC Voltmeter (0~±100V), Resolution: 2.5mV~50mV
• Programmable Frequency: 100Hz, 1KHz, 10KHz, 100KHz and 1MHz
• Programmable DC Voltage Source (0~±12V), DC Current Source (0~±200mA),
AC Voltage Source (0~7Vrms)
• Measuring Range :
> Resistance : 1.0Ω~40MΩ
> Transistor : ±5V
> Capacitance : 1.0pF~40mF
> Zener Diode : 0.1V~48V
> Inductance : 1.0µH~60H
> Diode : 0.1V~9.99V
• Frequency range 0~100KHz, Resolution:0.15Hz
• Test Pins: Standard 256pins (expandable in increments of 128 pins to 3200 pins)
• Test Steps: Standard 20480 steps
• Test Time : Open/Short check 1 sec./1000pins (0.8msec.~22msec./ component)
• Equipped with Automatic Guarding points selection, Auto-alignment function and Multiple Safety Protection Design
• Alternative learning module (for automatic generation of IC Reverse Check program)
• Built in system self-diagnostic function
• Networking available
• Test program remote download modification and users authority management
• Quality management and statistic analysis reports
• BoardView function – for instant defect device and pin allocation
• Polarity Detection of Capacitors (with leakage current measurement)
• Testing of small Capacitors and Inductors with 1MHz AC signal possible
• Transistor, FET, SCR, and Photo Coupler testing mode available
• Arbitrary Waveform Generator (AWG)
• Pin Contact Check capability